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kc3-lang/libbsd/test/arc4random.c

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  • Author : Guillem Jover
    Date : 2016-01-11 02:21:15
    Hash : e4ab2c62
    Message : test: Fix success return code for arc4random unit test

  • test/arc4random.c
  • /*
     * Copyright © 2015 Guillem Jover <guillem@hadrons.org>
     *
     * Redistribution and use in source and binary forms, with or without
     * modification, are permitted provided that the following conditions
     * are met:
     * 1. Redistributions of source code must retain the above copyright
     *    notice, this list of conditions and the following disclaimer.
     * 2. Redistributions in binary form must reproduce the above copyright
     *    notice, this list of conditions and the following disclaimer in the
     *    documentation and/or other materials provided with the distribution.
     * 3. The name of the author may not be used to endorse or promote products
     *    derived from this software without specific prior written permission.
     *
     * THIS SOFTWARE IS PROVIDED ``AS IS'' AND ANY EXPRESS OR IMPLIED WARRANTIES,
     * INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY
     * AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED.  IN NO EVENT SHALL
     * THE AUTHOR BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL,
     * EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO,
     * PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS;
     * OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY,
     * WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR
     * OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
     * ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
     */
    
    #include <assert.h>
    #include <stdlib.h>
    
    #include <testu01/gdef.h>
    #include <testu01/unif01.h>
    #include <testu01/swrite.h>
    #include <testu01/bbattery.h>
    
    #define TEST_OK		0
    #define TEST_SKIP	77
    #define TEST_DIE	99
    
    #define test_print(msg, ...) \
    	printf("TEST: " msg "\n", __VA_ARGS__)
    #define test_res(idx, name, pval, action) \
    	test_print("[%4d] (%s) pVal[%d] = %f -> %s", \
    	           idx, name[idx], i, pval[idx], action)
    
    static int test_failed = 0;
    
    static void
    test_battery_result(void)
    {
    	char **testNames = bbattery_TestNames;
    	double *pVal = bbattery_pVal;
    	double pSuspect = 0.001;
    
    	test_print("bbattery_NTests = %d", bbattery_NTests);
    	for (int i = 0; i < bbattery_NTests; i++) {
    		/* That test was not done: pVal = -1. */
    		if (pVal[i] < 0.0) {
    			test_res(i, testNames, pVal, "SKIP");
    			continue;
    		}
    
    		/* That test passed or failed. */
    		if ((pVal[i] >= pSuspect) &&
    		    (pVal[i] <= 1.0 - pSuspect)) {
    			test_res(i, testNames, pVal, "PASS");
    		} else {
    			test_res(i, testNames, pVal, "FAIL");
    			test_failed++;
    		}
    	}
    }
    
    int
    main(int argc, char **argv)
    {
    	unif01_Gen *gen;
    	int rc;
    
    	gen = unif01_CreateExternGenBits("arc4random", arc4random);
    
    	/* XXX: The following battery does not set pVal, so we cannot check
    	 * the results. */
    	bbattery_FIPS_140_2(gen);
    
    	/* XXX: The following battery fails one test. */
    	bbattery_pseudoDIEHARD(gen);
    	test_battery_result();
    
    	bbattery_Rabbit(gen, 33554432);
    	test_battery_result();
    
    	bbattery_SmallCrush(gen);
    	test_battery_result();
    
    	unif01_DeleteExternGenBits(gen);
    
    	if (test_failed) {
    		test_print("failed tests = %d", test_failed);
    		/* XXX: We should probably FAIL the test, but we currently
    		 * have one test always failing. */
    		rc = TEST_SKIP;
    	} else {
    		rc = TEST_OK;
    	}
    
    	return rc;
    }