kc3-lang/gnulib/tests/test-exp-ieee.h

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• Hash : 32a72f45
  Author :
  Date : 2023-01-01T01:14:21
  

  maint: run 'make update-copyright'
  

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• tests/test-exp-ieee.h

• /* Test of exp*() function family.
     Copyright (C) 2012-2023 Free Software Foundation, Inc.
  
     This program is free software: you can redistribute it and/or modify
     it under the terms of the GNU General Public License as published by
     the Free Software Foundation, either version 3 of the License, or
     (at your option) any later version.
  
     This program is distributed in the hope that it will be useful,
     but WITHOUT ANY WARRANTY; without even the implied warranty of
     MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.  See the
     GNU General Public License for more details.
  
     You should have received a copy of the GNU General Public License
     along with this program.  If not, see <https://www.gnu.org/licenses/>.  */
  
  static void
  test_function (void)
  {
    /* [MX] shaded specification in POSIX.  */
  
    /* Underflow.  */
    {
      volatile DOUBLE z = EXP (-100000.0);
      ASSERT (z == L_(0.0));
      ASSERT (!signbit (z));
    }
  
    /* NaN.  */
    ASSERT (ISNAN (EXP (NAN)));
  
    /* Zero.  */
    ASSERT (EXP (L_(0.0)) == L_(1.0));
    ASSERT (EXP (MINUS_ZERO) == L_(1.0));
  
    /* Infinity.  */
    {
      DOUBLE z = EXP (- INFINITY);
      ASSERT (z == L_(0.0));
      ASSERT (!signbit (z));
    }
    ASSERT (EXP (INFINITY) == INFINITY);
  }
  

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