kc3-lang/libbsd/test/arc4random.c

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• Hash : 58bef83f
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  Date : 2015-11-16T01:12:24
  

  test: Add unit test for arc4random()

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• test/arc4random.c

• /*
   * Copyright © 2015 Guillem Jover <guillem@hadrons.org>
   *
   * Redistribution and use in source and binary forms, with or without
   * modification, are permitted provided that the following conditions
   * are met:
   * 1. Redistributions of source code must retain the above copyright
   *    notice, this list of conditions and the following disclaimer.
   * 2. Redistributions in binary form must reproduce the above copyright
   *    notice, this list of conditions and the following disclaimer in the
   *    documentation and/or other materials provided with the distribution.
   * 3. The name of the author may not be used to endorse or promote products
   *    derived from this software without specific prior written permission.
   *
   * THIS SOFTWARE IS PROVIDED ``AS IS'' AND ANY EXPRESS OR IMPLIED WARRANTIES,
   * INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY
   * AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED.  IN NO EVENT SHALL
   * THE AUTHOR BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL,
   * EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO,
   * PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS;
   * OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY,
   * WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR
   * OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
   * ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
   */
  
  #include <assert.h>
  #include <stdlib.h>
  
  #include <testu01/gdef.h>
  #include <testu01/unif01.h>
  #include <testu01/swrite.h>
  #include <testu01/bbattery.h>
  
  #define TEST_OK		0
  #define TEST_SKIP	77
  #define TEST_DIE	99
  
  #define test_print(msg, ...) \
  	printf("TEST: " msg "\n", __VA_ARGS__)
  #define test_res(idx, name, pval, action) \
  	test_print("[%4d] (%s) pVal[%d] = %f -> %s", \
  	           idx, name[idx], i, pval[idx], action)
  
  static int test_failed = 0;
  
  static void
  test_battery_result(void)
  {
  	char **testNames = bbattery_TestNames;
  	double *pVal = bbattery_pVal;
  	double pSuspect = 0.001;
  
  	test_print("bbattery_NTests = %d", bbattery_NTests);
  	for (int i = 0; i < bbattery_NTests; i++) {
  		/* That test was not done: pVal = -1. */
  		if (pVal[i] < 0.0) {
  			test_res(i, testNames, pVal, "SKIP");
  			continue;
  		}
  
  		/* That test passed or failed. */
  		if ((pVal[i] >= pSuspect) &&
  		    (pVal[i] <= 1.0 - pSuspect)) {
  			test_res(i, testNames, pVal, "PASS");
  		} else {
  			test_res(i, testNames, pVal, "FAIL");
  			test_failed++;
  		}
  	}
  }
  
  int
  main(int argc, char **argv)
  {
  	unif01_Gen *gen;
  	int rc;
  
  	gen = unif01_CreateExternGenBits("arc4random", arc4random);
  
  	/* XXX: The following battery does not set pVal, so we cannot check
  	 * the results. */
  	bbattery_FIPS_140_2(gen);
  
  	/* XXX: The following battery fails one test. */
  	bbattery_pseudoDIEHARD(gen);
  	test_battery_result();
  
  	bbattery_Rabbit(gen, 33554432);
  	test_battery_result();
  
  	bbattery_SmallCrush(gen);
  	test_battery_result();
  
  	unif01_DeleteExternGenBits(gen);
  
  	if (test_failed) {
  		test_print("failed tests = %d", test_failed);
  		/* XXX: We should probably FAIL the test, but we currently
  		 * have one test always failing. */
  		rc = TEST_SKIP;
  	}
  
  	return rc;
  }
  

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